Fourth EXCITE Transnational Access Call

DESCRIPTION:
High resolution transmission electron microscope, FEI TITAN with 300 kV acceleration voltage. The Titan microscope is a image-aberration-corrected STEM/TEM with .07 nm resolution, equipped with a high-brightness Schottky-field emission e-source, and a high-resolution Gatan Imaging Filter (GIF). It has two 2048x2048 slow-scan CCD cameras. The high resolution STEM is equipped with HAADF detector and EDAX energy dispersive X-ray for AEM analyses. Includes different sample holder, one of them a tomography holder with ± 80 degrees to minimize the missing wedge in 3D reconstructions.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
X-ray micro-CT ZEISS Xradia 510 Versa. This high resolution µ-CT is able to analyze non-destructively a whole range of sample types (solid and/or liquid) and geometries. Extending synchrotron-caliber performance, it achieves 0.7 µm true spatial resolution and voxel size of 70 nm. It has advanced absorption contrast along with innovative phase contrast. Multi-length scale capabilities enable to image the same sample across a wide range of magnifications, reducing dependence upon geometric magnification, thereby enabling to maintain submicron resolution down to 700 nm at large working distances. Additional capabilities: a) T-controlled stage; b) Mechanical testing device; c) Flow-through cylindrical stage.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
The Tescan UniTOM XL offers voxel sizes ranging between ~1 and 150µm (unbinned data) on millimeter to decimeter-sized samples. The system is equipped with two detectors, an 8Mpx flat panel detector and a spectral line detector with up to 128 channels. An in-situ stage enables 4D experiments. Test cell to be provided by the user. Possibility to perform in situ/in operando analyses and chemical mapping (prototype).

SAMPLE PREPARATION:
Available at the facility. The facility can drill sample cores from consolidated rock samples. The resulting sample sizes range from ~1.5mm up to 5cm in diameter. Sample height respectively ranges from 1cm up to 5cm.

SOFTWARE AVAILABLE AT THE FACILITY:
ORS Dragonfly and open source software such as Fiji.

Equipment unavailable from 23/12/2023 - 01/01/2023

DESCRIPTION:
The Zeiss Xradia Versa 510 offers voxel sizes ranging between ~250nm and ~40µm (unbinned data) on respectively millimeter to centimeter-sized samples. The system is equipped with a 4Mpx CCD detector. An in-situ stage enables 4D experiments. Test cell to be provided by the user. Possibility to perform in situ/in operando analyses.

SAMPLE PREPARATION:
Available at the facility. The facility can drill sample cores from consolidated rock samples. The resulting sample sizes range from ~1.5mm up to 5cm in diameter. Sample height respectively ranges from 1cm up to 5cm.

SOFTWARE AVAILABLE AT THE FACILITY:
ORS Dragonfly and open source software such as Fiji.

Equipment unavailable from 23/12/2023 - 01/01/2023

DESCRIPTION:
Lab-scale micro computed tomography scanner to characterize microstructures of a wide variation of materials. Samples with diameters of 1 mm to up to 5 cm can be scanned at a resolution of at minimum 1 micrometer.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Phoenix reconstruction software, Avizo 3D analyses software, Matlab/Python routines.

DESCRIPTION:
Lab-scale computed tomography scanner to image large samples focused on in-situ testing and imaging of materials. RocksSamples with diameters of 15 cm and length of over a meter can be scanned in tens of seconds at a resolution of at minimum 500 micrometer.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Phoenix reconstruction software, Avizo 3D analyses software, Matlab/Python routines.

DESCRIPTION:
FIB-SEM with Cryostage. Nordlys EBSD, Oxford xxx EDS, Gatan CL.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
Environmental SEM with Peltier cooling stage, 2x Bruker EDS and automated mineralogy.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
High-end SEM with low vacuum capabilities. Symmetry EBSD detector, Oxford xxx EDS, Delmic CL, Quorum Cryostage.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
30-300 kV (S)TEM. Double aberration corrected microscope with a variable acceleration voltage (30, 80, 200 and 300 kV), enabling high-resolution imaging up to 50 pm both in TEM and STEM imaging mode. Equipped with EDX spectrometry for chemical mapping, and ultra-high-resolution electron energy loss spectrometry (UHR-EELS) enabled by its double monochromator and Gatan Continuum filter. It also has a direct-direction Gatan K3 IS camera allowing imaging of soft and beam-sensitive materials.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
200 kV (S)TEM. High-brightness X-FEG electron gun, high-resolution imaging up tot 1.1 Angstrom, electron diffraction, electron tomography, and high-sensitivity 2D EDX chemical mapping (Super-X).

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
Field Emission Electron probe microanalyser, equipped with 5 WDS spectrometers, SDD ED system, CL system (panchromatic imaging and xCLent hyperspectral CL).

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
High-resolution X-ray tomography microscope system equipped with a 160kV high-energy, high-power microfocus X-ray source, several high-contrast detectors and a large flat panel detector as well as in situ experimental capabilities.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
QuantaFEG650 with sample stages for twelve thin sections or fourteen 25mm resin blocks, or large samples. It can operate in high vacuum, low vacuum or environmental mode. SE/BSE/Cathodoluminescence imaging/tiling. Spot Analysis/Mapping/Tiling with EDS: 2 x Bruker XFlash 6|30. Quantitative Evaluation of Minerals by SCANning electron microscopy (QEMSCAN): this EDS based method aids in phase mapping, modal proportion analysis, particle and mineral grain size and shape among other things using the iDiscover software package. Mapping with EBSD: Bruker e-FlashHR. Typically used to explore phase id, grain size and morphology distributions, grain orientation, texture, and strain deformation at 100nm to cm scale.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
ThermoFisher Maps (SE/BSE/CL imaging); ThermoFisher iMeasure, iDiscover, NanoMin (EDS + BSE); Bruker Esprit, MatLab-MTEX (EDS, EBSD); Jeol FEG EPMA - Jeol software and Probe software.

Equipment unavailable from 01/11/2023 - 31/12/2023

DESCRIPTION:
Newly installed (Oct 2021) Jeol JXA-iHP200F is fitted with 5 WDS spectrometers, 1 Jeol EDS, 1 PanCL and Transmitted/reflected Optical microscope. Cold finger and plasma cleaner available. EDS/WDS combined accurate analysis. Stage mapping allows for large areas analysis (up to 90mm^2). Thin sections (28mm x 50mm x 1.5mm) and round stubs (both 25.5mm and 30mm diameter) are suitable. The FEG source allows for trace element analysis with large probe currents (1nA to 10microA) and high-resolution imaging in conjunction with very high magnification, small area chemical analysis allowing for particles smaller than 100nm to be chemically mapped.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
ThermoFisher Maps (SE/BSE/CL imaging); ThermoFisher iMeasure, iDiscover, NanoMin (EDS + BSE); Bruker Esprit, MatLab-MTEX (EDS, EBSD); Jeol FEG EPMA - Jeol software and Probe software.

Equipment unavailable from 01/11/2023 - 31/12/2023

DESCRIPTION:
JEOL proprietary software (SunOS 9); Accelerating voltage: 0.2 to 30 kV (0.1 steps); Electron probe current range: 10^-12 to 10^-5 A; Electron probe current stability: ± 0.5 X 10^-3/hr, ± 0.3X10^-3/24hr; Spectrometers: WDS (4): TAP, PETJ, PETH, LIF, LIFH, LDE1; EDS: Oxford Instruments Model X-act; Resolution at 5.9 keV : 129 eV; Energy range (keV) 20; Strobe resolution (eV) 42.26; Secondary-electron (SE) and backscattered-electron (BSE) imaging: SE image resolution: 6 nm; BSE image modes: composition and topography; Scanning image magnification: 40X to 300,000X; Sample Specifications: Maximum size: 100 x 100 x 50 mm; Maximum analyzable area: 90 x 90 mm.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Standard "Jeol " for WDS spectrometers and standard "Oxford Analytics Processing and acquisition software".

DESCRIPTION:
Hitachi SU5000 FEG-SEM including low-vacuum mode. Dual Bruker Quantax Xflash 30 EDS system, Bruker e-Flash high resolution EBSD system with Argus, software CrossCourt4 Rapide for high-angular resolution EBSD (HR-EBSD), Delmic Sparc cathodoluminescence system with spectral analysis. Sample prep facilities: carbon coater Cressington 208C, vibratory polishing machine QPol Vibro (for EBSD samples).

SAMPLE PREPARATION:
Only carbon coating of the sample is offered by the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker Esprit 2.3, CrossCourt4 Rapide (HR-EBSD), Odemis (CL).

DESCRIPTION:
Core-Tom (tescan), Resolution >5um, Sample sizes < 15 cm diameter and < 90 cm high. Possibility to measure k-edge of elements inside sample. Possibility of in-situ / time-lapse studies that require large rigs.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Dragonfly, Panthera.

Equipment unavailable from 18/12/2023 - 06/01/2024

DESCRIPTION:
Micro-CT system (Zeiss Xradia 410 Versa) equipped with a microfocus X-ray source capable of energies from 40 to 150 kV. Detectors with magnifications ranging from 0.4X to 20X (resolution down to 0.9 µm). Imaging mode in absorption and phase contrast. Device to perform high temperature-high pressure in-situ experiments and time-resolved (4D) imaging.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Zeiss Scout & Scan and Zeiss XRM reconstructor; image processing and simulators (Avizo/PerGeos, Dragonfly/ORS, ImageJ/Fiji, Python libraries, Pore3D, Blob3D, 3DViewer).

DESCRIPTION:
FEG-SEM equipped with a Symmetry EBSD camera and EDS detector from Oxford Instruments. Inclined column allows the mapping of relatively large areas (few cm2). Instruments & an EDS detector allowing simultaneous crystallographic and chemical mapping of thin sections or polished sections (up to 4x3 cm). The maximum resolution of crystallographic maps on geological materials is around 0.05 µm, and the acquisition frequency can reach 500 Hz.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility. Prefer to have the sample preparation done at the facility to avoid loosing time during TNA with poorly polished samples.

SOFTWARE AVAILABLE AT THE FACILITY:
Aztec software, MTEX, Channel 5.

DESCRIPTION:
The EPMA is a Jeol JXA-8500F- Field Emission Electron Microprobe, equipped with 4 WDS spectrometers and 1 EDS spectrometer. It is mainly used to do quantitative analysis either at certain points or areas of the sample. Before arriving to the Lab, samples ( round blocks or thin sections) must be previously polished with diamond paste ( until ¼ µm). Besides quantitative analysis it is possible to obtain Secondary Electron Images and Electron Backscattered images for phase contrast and Element Line profiles and Element Phase maps. Resolution is dependent on the type of sample but is can vary from some hundreds of nm to a couple of µm.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Standard ""JEOL"" for WDS spectrometers."

DESCRIPTION:
FEI Helios G4 Dual Beam Helios G4 UC. Resolution: 0.6 nm at 30 kV STEM, 0.7 nm at 1 kV, 1.0 nm at 500 V (ICD). Electron beam current range: 0.8 pA to 100 nA, accelerating voltage range: 200 V to 30 kV. Maximum horizontal field width: 2.3 mm at 4 mm WD. Ion beam current range: 0.1 pA to 65 nA, accelerating Voltage range: 500 V to 30 kV. Elstar in-lens SE/BSE detector; Everhart-Thornley SE detector (ETD); Retractable STEM3+ detector with BF/DF/HAADF segments; Gas Injection System; Easylift for precise in situ sample manipulation; AutoTEM wizard automated sample preparation.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility and preparation time should be included as access days.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Equipment unavailable from 11/12/2023 - 12/01/2024

DESCRIPTION:
A FEI Quanta 3D FEG is a state-of-the-art Dual Beam device. SEM column optimized for high-brightness & high-current at acceleration voltage from 2kV to 30kV and probe currents from 1pA to 65 pA. Magnifications: x30 – x1.000.000; SE & BSE detectors; Low-vacuum SED (used in low vacuum mode); EDAX TEAM software for EBSD and EDS. Maximum electron beam resolution - 0.8 nm at 30kV; Focused Ion Beam Column: Ion source – 1kV to 30 kV. Maximum ion beam resolution - 7 nm at 30kV. Omniprobe nanomanipulator. In situ Pt and C gas injection systems. Avizo Fire for 3D reconstruction in nanotomography.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility and preparation time should be included as access days.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Equipment unavailable from 11/12/2023 - 12/01/2024

DESCRIPTION:
The ZEISS Ultra Plus field emission scanning electron microscope allows recording of high-resolution images. The complete detection system of the Ultra Plus combines various detectors: the In-Lens & SE detector for high-resolution images, the In-Lens Energy Selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for an impressive material contrast of each sample, and energy dispersive spectroscopy (EDS) for elemental analysis. We can use the ZEISS Ultra Plus in a variety of scientific areas, including material and geological research. In life sciences, the Ultra Plus allows us to easily analyze samples with high throughput and receive large amounts of data. In addition, the Ultra Plus also offers the possibility of analysing natural biological samples with cryo-attachment and cathodoluminescence (KL) for minerals and material science samples.

SAMPLE PREPARATION:
No sample preparation offered for this equipment. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Equipment unavailable from 11/12/2023 - 12/01/2024

DESCRIPTION:
FEI Tecnai G2 F20 X-Twin (200 kV) (space resolution is < 0.3 nm at 200 kV); FEG electron source; HAADF Detector; Gatan Tridiem (EELS, EFTEM); EDAX energy dispersive X-ray spectroscopy system; TEM sample holders: Gatan double-tilt holder; Single-tilt tomography holder; low background double-tilt holder; Single-tilt rotation holder; Gatan double-tilt liquid nitrogen holder; Gatan heating holder.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility and preparation time should be included as access days.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Equipment unavailable from 11/12/2023 - 12/01/2024

DESCRIPTION:
Thermo Fisher Scientific Themis Z (3.1); Cs S-CORR Probe Corrector (80-300 kV) (space resolution is < 0.06 nm at 300 kV); X-FEG electron source with a monochromator (energy resolution is < 0.3 eV); HAADF, DF2, DF4 and BF Detectors; STEM Imaging of light elements; SuperX energy dispersive X-ray spectroscopy system; Gatan Imaging Filter Continuum ER/1065 (EELS, EFTEM); TEM, STEM and EDX Tomography Data Acquisition Software; Low-dose Exposure Technique; Precession electron diffraction.

SAMPLE PREPARATION:
Available at the facility. Needs to be discussed with the facility and preparation time should be included as access days.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Equipment unavailable from 11/12/2023 - 12/01/2024

DESCRIPTION:
Custom-built setup, VISCOM XT9100 microfocus source (Mo, Ag or Cu), Vosskuhler CCD-camera, SCINT-X pixeled scintillator - optimized for 17 keV radiation, 4-µm spatial resolution with frame rates up to 6 per second.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Nikon Inspect-X and CT Pro, VGStudio Max, open-source image processing software.

DESCRIPTION:
Nikon XT H 225 ST, 225kV UltraFocus reflection target (Mo, W, Ag, Cu) and 180 kV transmission target, Perkin Elmer 1620 flat panel detector, 300 µm to 10 µm resolution - depending on the sample size, max sample size 30 cm/50 kg.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Nikon Inspect-X and CT Pro, VGStudio Max, open-source image processing software.

DESCRIPTION:
Bespoke Instrument. 160 kV transmission/reflection source. Micos UPR-100-Air rotary table for sample/cell masses up to 2 kg. Perkin Elmer 0822 XRD, a-Si, 16 bit, 1 MP flat panel camera (Gadox scintillator). Rad-icon shadocam 4K, CMOS, 12 bit, 4 MP flat panel camera. Sample size up to 100 mm diameter. Long samples acquired in multiple scans.

SAMPLE PREPARATION:
Available at the facility. Cutting and preparation of small cores (3-10 mm diameter) from rock (or similar engineered materials e.g. cement).

SOFTWARE AVAILABLE AT THE FACILITY:
Acquisition code written in-house. Processing codes include Avizo, Dragonfly (academic license only) and open source software (e.g. ImageJ).

DESCRIPTION:
A versatile micro-CT system optimized for multi-scale 3D and high temporal resolution 4D imaging from core samples down to pore samples. Key benefits: i) Multi-scale imaging from core down to pore/grain scale, ii) Volume-of-Interest Scanning (VOIS), iii) Scan up to 1 m tall cores, iv) Fast scanning & high sample throughput, v) In situ integration option, vi) Dynamic micro-CT acquisition with temporal resolutions < 10 seconds, and vii) Software tools for dynamic acquisition, reconstruction and visualization.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, VGStudioMax, Avizo, Dragonfly.

ADD-ON MODULES:
Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

DESCRIPTION:
The Environmental Micro-CT or EMCT system is a rather unique, gantry-based high-resolution setup developed for fast CT scanning and in-situ monitoring. The design of a horizontal gantry allows for the installation of a large number of add-on modules such as flow cells, pressure stages, temperature stages, in a convenient vertical position without a limitation on tubes and wires. Furthermore, the components are chosen to enable fast and continuous CT scanning at up to 5 full rotations per minute.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, VGStudioMax, Avizo, Dragonfly.

ADD-ON MODULES:
Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

DESCRIPTION:
The High-Energy CT system Optimized for Research or HECTOR is the workhorse of our systems. It is equipped with a 240 kV X-ray tube from X-RAY WorX, a PerkinElmer 1620 flat-panel detector and a rotation stage able to carry samples up to 80 kg. Mounted on a total of 5 motorized linear stages, this system covers a very wide range of samples with a best achievable spatial resolution of approximately 3 micron and an image resolution of 2048x2048 pixels. Two additional piezo stages allow for an exact positioning of the sample on the rotation axis.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, VGStudioMax, Avizo, Dragonfly.

ADD-ON MODULES:
Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

DESCRIPTION:
The very high resolution scanner Medusa combines a Photonic Science VHR detector with a large-area Varian flat-panel detector to allow for both low-density objects such as biological tissue, and high-density samples such as geomaterials. Both detectors are mounted on motorized linear stages for easy and fast switching and high accuracy. The setup also allows for a very long propagation distance of 1.4m, which can be exploited for phase-contrast experiments. The FeinFocus transmission tube allows for a resolution of approximately 0.9 µm and for X-ray targets of different material and thickness.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, VGStudioMax, Avizo, Dragonfly.

ADD-ON MODULES:
Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

DESCRIPTION:
This versatile multi-resolution X-ray tomography scanner is equipped with two separate X-ray tubes and two different X-ray detectors to allow for optimal scanning conditions for a very wide range of samples. The open-type Hamamatsu transmission tube is used for very high resolution CT scans, where a resolution of approximately 0.4 micron can be achieved (given very small samples), whereas the closed-type Hamamatsu directional tube head is used for larger samples. On the detector side, an 11 megapixel Photonic Science VHR CCD camera with a pixel size of approximately 7² µm² is complemented with a large-area Varian flat-panel detector.

SAMPLE PREPARATION:
No sample preparation offered by the facility. Requirements need to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, VGStudioMax, Avizo, Dragonfly.

ADD-ON MODULES:
Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

DESCRIPTION:
Dual beam Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) instrument SEM/FIB, Pt, Teos, and Carbon Deposition. FIB/SEM tomography.

SAMPLE PREPARATION:
FIB preparation, preparation of powders and sample coating offered by the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
INCA/AZtec, Atlas, Avizo and open-source software such as Hyperspy.

DESCRIPTION:
Dual beam Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) instrument SEM/FIB, TEM lamella sample preparation (Omniprobe), Pt, Teos, and Carbon Deposition. FIB/SEM tomography, EDS and Electron Backscattered Diffraction analysis are provided , with Oxford Instruments detectors.

SAMPLE PREPARATION:
FIB preparation, preparation of powders and sample coating offered by the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
INCA/AZtec, Atlas, Avizo and open-source software such as Hyperspy.

DESCRIPTION:
Field Emission Scanning Electron Microscope, equiped with SDD ED system and EBSD.

SAMPLE PREPARATION:
FIB preparation, preparation of powders and sample coating offered by the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
INCA/AZtec, Atlas, Avizo and open-source software such as Hyperspy.

DESCRIPTION:
Aberration Corrected atomic resolution, monochromated, Scanning Transmission Electron Microscope. The instrument offers EDS (Thermo Fisher Super-X) and high energy resolution EELS analysis (Gatan Continuum 1066). Magnetic imaging, Lorenz magnetic imaging, electron holography Scanning Electron Diffraction (SED) (including Quantum Detectors Merlin direct detection camera). The primary Aberration Corrected atomic resolution, monochromated, Scanning Transmission Electron Microscopy (STEM). The instrument offers EDS (Thermo Fisher Super-X) and high energy resolution EELS analysis (Gatan Continuum 1066, 0.15 eV or better). A rotatable Mollenstedt-Ducker biprism allows for off-axis holography and a Lorentz lens allows field-free imaging of magnetic specimens. Scanning Electron Diffraction (SED) with precession (Nanomegas) capability includes a Quantum Detectors Merlin direct detection camera. The primary beam energy is 300 kV and the system is also aligned at 80 kV and 40 kV.

SAMPLE PREPARATION:
FIB preparation, preparation of powders and sample coating offered by the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
INCA/AZtec, Atlas, Avizo and open-source software such as Hyperspy.

DESCRIPTION:
TEM, STEM and imaging, Scanning Electron Diffraction (SED) with precession (Nanomegas) and electron tomography. In situ-studies are enabled by Gatan OneView camera combined with heating (DENS Wildfire) and liquid (Protochips Poseidon) holders.

SAMPLE PREPARATION:
FIB preparation, preparation of powders and sample coating offered by the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:\ INCA/AZtec, Atlas, Avizo and open-source software such as Hyperspy.

DESCRIPTION:
TEM imaging and fast chemical mapping in scanning transmission electron microscope (STEM). Its primary beam energy is 200keV, with a lower energy of 80 keV for materials sensitive to knock-on damage. FEIs Super-X system provides high collection (>0.9 sr solid angle) and high count rates (>250 kcps) EDS analysis. Electron Energy Loss Spectroscopy (EELS) using Gatan's Enfinium ER 977 spectrometer allows Scan Module for Dual EELS (sequential low-loss and high-loss spectrum acquisition) and RangeEELS.

SAMPLE PREPARATION:
FIB preparation, preparation of powders and sample coating offered by the facility. Needs to be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
INCA/AZtec, Atlas, Avizo and open-source software such as Hyperspy.