EXCITE2 Call 3

DESCRIPTION: RX Solutions EasyTOM XL Ultra

SAMPLE PREPARATION: No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY: Avizo, Dragonfly, X-AID, PyPore3D

DESCRIPTION: XRadia MicroXCT-400

SAMPLE PREPARATION: No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY: ZAG Avizo, Dragonfly, X-AID, PyPore3D

DESCRIPTION:
Atomic force microscope NX20 (Park Systems). This AFM allows working in contact, non-contact, lateral force microscopy (LFM), phase imaging and tapping AFM modes. It has a scan range of up to 100 µm. It has an open space for samples up to 150 mm x 150 mm, and thickness up to 20 mm. It has a universal liquid cell (open or closed) with liquid/gas perfusion with temperature control range up to +180º C (in air) or up to +150ª C (within liquids). Since its acquisition, it has been offering service to in-house and international researchers studying morphological and chemical-physical properties of molecular nanostructures; dynamic processes, such as mineral dissolution and growth; protein aggregates, biofilms and colloids; nanolithography, electronic conductivity and mechanical properties of electronic circuits.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
High resolution transmission electron microscope, FEI (ThermoFischer Scientific) TITAN with 300 kV acceleration voltage. The Titan microscope is a image-aberration-corrected STEM/TEM with .07 nm resolution, equipped with a high-brightness Schottky-field emission e-source, and a high-resolution Gatan Imaging Filter (GIF). It has two 2048x2048 slow-scan CCD cameras. The high resolution STEM is equipped with HAADF detector and EDAX energy dispersive X-ray for AEM analyses. Includes different sample holder, one of them a tomography holder with ± 80 degrees to minimize the missing wedge in 3D reconstructions.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
X-ray micro-CT ZEISS Xradia 510 Versa. This high resolution µ-CT is able to analyze non-destructively a whole range of sample types (solid and/or liquid) and geometries. Extending synchrotron-caliber performance, it achieves 0.7 μm true spatial resolution and voxel size of 70 nm. It has advanced absorption contrast along with innovative phase contrast. Multi-length scale capabilities enable to image the same sample across a wide range of magnifications, reducing dependence upon geometric magnification, thereby enabling to maintain submicron resolution down to 700 nm at large working distances. Additional capabilities: a) T-controlled stage; b) Mechanical testing device; c) Flow-through cylindrical stage.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
High-quality data CT using special helical trajectory, wide cone beam, iterative reconstruction algorithm. Perfect machine for cylindrical shaped samples like drill cores and battery cells.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect.

DESCRIPTION:
Industrial CT with a powerful microfocus tube, air-bearings, fixed detector-source distance for better metrological performance. Excellent device for structural analysis of high-dense samples including various forms of metals.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect.

DESCRIPTION:
Versatile CT system in walking protection cabinet equipped with x-ray micro-and nano-focus sources and large 4k detector, 7 axes on massive granite base and air-condition. Good system for large scale samples, porosity analysis of a smal piece of rocks, and in-situ experiments.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect

DESCRIPTION:
An X-ray microscope and submicron-CT system capable of high-quality scans with voxel sizes less than 0.19 μm in a field of view of 0.9 × 0.75 mm. Its dual-target X-ray source and phase-contrast capability facilitate high-contrast imaging of both light materials like plants, polymers, or textile fibers, and denser samples from fields such as geology or cultural heritage.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect.

DESCRIPTION:
Local Electrode Atom Probe with reflectron ion flight path. Voltage and UV laser pulsing modes.

SAMPLE PREPARATION:
Yes. Atom probe tomography is undertaken on small, needle-shaped specimens. These specimens are prepared at Curtin University using site-specific targeting in the FIB-SEM. Atom probe specimens are typically taken from flat petrographic thin sections or polished blocks . We do not manufacture thin sections or polished blocks within the Facility and users must provide these.

SOFTWARE AVAILABLE AT THE FACILITY:
Data Acquisition and Processing will utilise Cameca's AP Suite software and is available as part of the standard workflow.

DESCRIPTION:
TESCAN Lyra3 Ga+ focused ion beam SEM (FIB-SEM). MIRA Electron column (Field Emission). Cobra Ion column (monoisotopic 69Ga+). MonoGIS with Pt reservoir. SmarAct Nanomanipulator. Tofwerk ToF-SIMS. Oxford EDS detector. Oxford EBSD detector.

SAMPLE PREPARATION:
Yes. Atom probe tomography is undertaken on small, needle-shaped specimens. These specimens are prepared at Curtin University using site-specific targeting in the FIB-SEM. Atom probe specimens are typically taken from flat petrographic thin sections or polished blocks . We do not manufacture thin sections or polished blocks within the Facility and users must provide these.

SOFTWARE AVAILABLE AT THE FACILITY:
Data Acquisition and Processing will utilise Cameca's AP Suite software and is available as part of the standard workflow.

DESCRIPTION:
The Tescan DynaTOM targets dynamic tests or the analysis of non-consolidated samples. The system is equipped with a 3Mpx flat panel detector and an X-ray source, mounted onto a horizontal gantry. The samples remain static during the analysis. The system offers voxel sizes ranging between ~1 and 150µm (unbinned data) on millimeter to decimeter-sized samples. Designed to perform in situ/in operando analyses. Test cell to be provided by the user.

SAMPLE PREPARATION:
Yes. Precising drill available to core samples with diameters ranging from ~1 to 40 mm (depending on sample). Safety hood and precision balance available for preparation of solutions or working with chemicals.

SOFTWARE AVAILABLE AT THE FACILITY:
CPU/GPU image processing server available on site. Several software packages for image analysis ORS Dragonfly, Fiji) and data processing (Matlab, Python) are available.

DESCRIPTION:
The Tescan UniTOM XL Spectral is a versatile system. It can handle a wide range of sample sizes (up to a meter in length) and can flexibly trade-off spatial and temporal resolution thanks to a 300W source and an 8Mpx flat panel detector. An in-situ stage enables in situ/in operando experiments. Test cell to be provided by the user. The system also features a spectral line detector with up to 128 channels enabling non-destructive 3D chemical differentiation.

SAMPLE PREPARATION:
Yes. Precising drill available to core samples with diameters ranging from ~1 to 40 mm (depending on sample). Safety hood and precision balance available for preparation of solutions or working with chemicals.

SOFTWARE AVAILABLE AT THE FACILITY:
CPU/GPU image processing server available on site. Several software packages for image analysis ORS Dragonfly, Fiji) and data processing (Matlab, Python) are available.

DESCRIPTION:
The Zeiss Xradia Versa 510 targets sub-micron imaging. It offers voxel sizes ranging between ~250nm and ~40µm (unbinned data) on respectively millimeter to centimeter-sized samples. The system is equipped with a 4Mpx CCD detector. An in-situ stage enables to perform in situ analyses. Test cell to be provided by the user.

SAMPLE PREPARATION:
Yes. Precising drill available to core samples with diameters ranging from ~1 to 40 mm (depending on sample). Safety hood and precision balance available for preparation of solutions or working with chemicals.

SOFTWARE AVAILABLE AT THE FACILITY:
CPU/GPU image processing server available on site. Several software packages for image analysis ORS Dragonfly, Fiji) and data processing (Matlab, Python) are available.

DESCRIPTION:
Lab-scale micro computed tomography scanner to characterize microstructures of a wide variation of materials and sample diemensions. Samples with diameters of 1 mm to up to 12 cm can be scanned at with a maximum of 3 micrometer resolution. Large samples (>30 cm in length) can be scanned and the equipment has the capability to perform dynamic imaging.

SAMPLE PREPARATION:
Yes. Coring options available for all sizes of samples from large blocks. Precision polishing also possible.

SOFTWARE AVAILABLE AT THE FACILITY:
Phoenix reconstruction software, Avizo 3D analyses software, Panthera reconstruction software, Dragonfly 3D analyses software Matlab/Python routines, Image J.

DESCRIPTION:
Lab-scale computed tomography scanner to image large samples focused on in-situ testing and imaging of materials. RocksSamples with diameters of 15 cm and length of over a meter can be scanned in tens of seconds at a resolution of at minimum 500 micrometer.

SAMPLE PREPARATION:
Yes. Coring options available for all sizes of samples from large blocks. Precision polishing also possible.

SOFTWARE AVAILABLE AT THE FACILITY:
Phoenix reconstruction software, Avizo 3D analyses software, Panthera reconstruction software, Dragonfly 3D analyses software Matlab/Python routines, Image J.

DESCRIPTION:
FIB-SEM with Cryostage. Nordlys EBSD, Oxford xxx EDS, Gatan CL.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
Environmental SEM with Peltier cooling stage, 2x Bruker EDS and automated mineralogy.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
High-end SEM with low vacuum capabilities. Symmetry EBSD detector, Oxford xxx EDS, Delmic CL, Quorum Cryostage.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
30-300 kV (S)TEM. Double aberration corrected microscope with a variable acceleration voltage (30, 80, 200 and 300 kV), enabling high-resolution imaging up to 50 pm both in TEM and STEM imaging mode. Equipped with EDX spectrometry for chemical mapping, and ultra-high-resolution electron energy loss spectrometry (UHR-EELS) enabled by its double monochromator and Gatan Continuum filter. It also has a direct-direction Gatan K3 IS camera allowing imaging of soft and beam-sensitive materials.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
200 kV (S)TEM. High-brightness X-FEG electron gun, high-resolution imaging up tot 1.1 Å, electron diffraction, electron tomography, and high-sensitivity 2D EDX chemical mapping (Super-X).

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
Field Emission Electron probe microanalyser, equipped with 5 WDS spectrometers, SDD ED system, CL system (panchromatic imaging and xCLent hyperspectral CL).

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
High-resolution X-ray tomography microscope system equipped with a 160kV high-energy, high-power microfocus X-ray source, several high-contrast detectors and a large flat panel detector as well as in situ experimental capabilities.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
Quanta FEG650 with sample stages for twelve thin sections or fourteen 25mm resin blocks, or large samples. It can operate in high vacuum, low vacuum or environmental mode. SE/BSE/Cathodoluminescence imaging/tiling. Spot Analysis/Mapping/Tiling with EDS: Oxford UltimMax 170mm. Phase identification through Oxford software AzTec. Mapping with EBSD: Oxford Symmetry 3. EBSD full stage mapping available. Typically used to explore phase id, grain size and morphology distributions, grain orientation, texture, and strain deformation at 100nm to cm scale.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
ThermoFisher Maps (SE/BSE/CL imaging); AzTec (EDS, EBSD), MatLab-MTEX (EDS, EBSD); Jeol FEG EPMA - Jeol software and Probe for EPMA software.

DESCRIPTION:
Jeol JXA-iHP200F fitted with 5 WDS spectrometers, 1 Jeol EDS, 1 PanCL and Transmitted/reflected Optical microscope. Cold finger and plasma cleaner available. EDS/WDS combined accurate analysis. Stage mapping allows for large areas analysis (up to 90mm^2). Thin sections (28mm x 50mm x 1.5mm) and round stubs (both 25.5mm and 30mm diameter) are suitable. The FEG source allows for trace element analysis with large probe currents (1nA to 10microA) and high-resolution imaging in conjunction with very high magnification, small area chemical analysis allowing for particles

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
ThermoFisher Maps (SE/BSE/CL imaging); AzTec (EDS, EBSD), MatLab-MTEX (EDS, EBSD); Jeol FEG EPMA - Jeol software and Probe for EPMA software.

DESCRIPTION:
The equipment can be run at high vacuum, low vacuum, or environmental mode, allowing imaging and chemical analysis of samples with or without a conductive coat. Moreover, the facility also hosts a SEM equipped with a cryogenic system.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
Equipment calibrated to quantify volatiles such as CO2, CH4 and N2 in fluid inclusions. The equipment can be coupled to a Linkam heating -freezing stage.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
The equipment offers a complete range of imaging technologies that enable acquiring Raman data from minute traces of material easily producing detailed chemical images and highly specific data from discrete points, lines, areas, and even volumes. With the possibility of using different excitation lasers (785, 532 nm) and three diffraction gratings (2400, 1800 and 1200lines/mm) they enable spectral resolution better than 2 cm-1.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
The InVia® Qontor includes an automatized piezoelectricstage, enabling 2D-Raman imaging and depth measurements (lateral and vertical resolution: 100 and 15 nm). The spectrometer is coupled to a Linkam Stage (80 – 1500 K), a closed-cycle He cryostat (10- 300K), and a continuous flow He cryostat with superconducting coil to applied external magnetic field (up to 7T; down to 3K). A high-pressure diamond anvil cell (up to 100 GPa) and high temperature (300 – 1000K) is also available for measurements.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
The nano-indenter located in the Friction Lab of the Department of Geosciences, UiO, is a G200X instrument that quickly delivers accurate, quantitative results of nano-mechanical testing of materials. It can be used for hardness, modulus, fracture toughness, and other property measurements, high-speed material property maps, as well as for creep tests. The instrument was purchased in 2021 and is equipped with two actuators that can be used to apply force up to 500 mN and in continuous stiffness mode (CSM).

SAMPLE PREPARATION:
No. Samples must be polished by the users (EBSD quality) before testing.

SOFTWARE AVAILABLE AT THE FACILITY:
Acquisition and processing software from the manufacturer (InView software). Data can be exported and processed with Microsoft Excel and MatLab.

DESCRIPTION:
Hitachi SU5000 FEG-SEM including low-vacuum mode. Dual Bruker Quantax Xflash 30 EDS system, Bruker e-Flash high resolution EBSD system with Argus, software CrossCourt4 Rapide for high-angular resolution EBSD (HR-EBSD), Delmic Sparc cathodoluminescence system with hyperspectral analysis. Note: The EDS and EBSD detectors will probably be replaced in fall 2025, so that other detectors will be available than specified here. This may also lead to some delays in the analyses.

SAMPLE PREPARATION:
Yes. Carbon coater Cressington 208C, vibratory polishing machine QPol Vibro (for EBSD samples).

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker Esprit 2.6, CrossCourt4 Rapide (HR-EBSD), Odemis (CL).

DESCRIPTION:
The SEM is connected to two detectors for performing energy dispersive X-ray spectroscopy (EDS). It is equipped with the MLA-Suite software from FEI for a rapid, spatially resolved, automatic, petrographic analysis of solid samples.

SAMPLE PREPARATION:
Yes. Sample preparation includes all steps in the production of samples of natural geological and synthetic inorganic materials for 2D and 3D analysis, e.g. polished sections, thin and thick sections. Sample preparation for multi-modality measurements must be discussed and planned in detail in advance. The preparation of organic materials such as plastics requires special arrangements. The preparation of biological materials for analytical purposes is not possible. The development of special preparation methods is possible within the framework of scientific cooperation.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Panthera.

DESCRIPTION:
TIMA-X is an automated mineralogy system for fast quantitative analysis of samples such as rocks, ores, concentrates, tailings, leach residues or smelter products. TIMA-X combines BSE and EDX analysis and offers the possibility for cathodoluminescence investigations

SAMPLE PREPARATION:
Yes. Sample preparation includes all steps in the production of samples of natural geological and synthetic inorganic materials for 2D and 3D analysis, e.g. polished sections, thin and thick sections. Sample preparation for multi-modality measurements must be discussed and planned in detail in advance. The preparation of organic materials such as plastics requires special arrangements. The preparation of biological materials for analytical purposes is not possible. The development of special preparation methods is possible within the framework of scientific cooperation.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Panthera.

DESCRIPTION:
Field Emission Electron probe microanalyser, equipped with 5 WDS spectrometers, SDD ED system, CL system.

SAMPLE PREPARATION:
Yes. Sample preparation includes all steps in the production of samples of natural geological and synthetic inorganic materials for 2D and 3D analysis, e.g. polished sections, thin and thick sections. Sample preparation for multi-modality measurements must be discussed and planned in detail in advance. The preparation of organic materials such as plastics requires special arrangements. The preparation of biological materials for analytical purposes is not possible. The development of special preparation methods is possible within the framework of scientific cooperation.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Panthera.

DESCRIPTION:
Core-Tom (tescan), Resolution >5um, Sample sizes < 15 cm diameter and < 90 cm high. Possibility to measure kedge of elements inside sample. Possibility of in-situ / time-lapse studies that require large rigs.

SAMPLE PREPARATION:
Yes. Sample preparation includes all steps in the production of samples of natural geological and synthetic inorganic materials for 2D and 3D analysis, e.g. polished sections, thin and thick sections. Sample preparation for multi-modality measurements must be discussed and planned in detail in advance. The preparation of organic materials such as plastics requires special arrangements. The preparation of biological materials for analytical purposes is not possible. The development of special preparation methods is possible within the framework of scientific cooperation.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Panthera.

DESCRIPTION:
The M4 TORNADO PLUS is a micro-XRF instrument designed for the detection of light elements. Two different X-ray tubes (Rh and W) are available with different spot sizes. The device is equipped with two EDS detectors. It can be operated in air under vacuum or with He flushing. AMICS is available as a software solution for automated mineralogy applications.

SAMPLE PREPARATION:
Yes. Sample preparation includes all steps in the production of samples of natural geological and synthetic inorganic materials for 2D and 3D analysis, e.g. polished sections, thin and thick sections. Sample preparation for multi-modality measurements must be discussed and planned in detail in advance. The preparation of organic materials such as plastics requires special arrangements. The preparation of biological materials for analytical purposes is not possible. The development of special preparation methods is possible within the framework of scientific cooperation.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Panthera.

DESCRIPTION:
The SkyScan 1172 microCT has an X-ray source of 30-100kV, 4-10 W, CCD detector 4kx4kx3k pixels. Pixel size: 0.9 μm to 25 μm; Resolution 3 µm in voxel can be reached, depending on the sample.

SAMPLE PREPARATION:
Yes. Laboratory available for basic sample preparation (dehydration, staining, embedding).

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker (CTAn, Dataviewer, CTVox, Nrecon), Dragonfly, Avizo 3D Pro - Availability via VDI Virtual Machine.

DESCRIPTION:
The SkyScan 2211 Multiscale XCT. It requires small samples in order to reach submicron resolution (pixel size ~300 nm). The sample size should be around 1 mm in diameter and composed of low density materials. Resolution 900 nm in voxel. For high energies (70 kV > Energy > 160 kV), large samples can be scanned (up to 15 cm in diameter, and 20 cm high, depending on the composition of the sample. Pixel size can span from 8 um to 50 um

SAMPLE PREPARATION:
Yes. Laboratory available for basic sample preparation (dehydration, staining, embedding).

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker (CTAn, Dataviewer, CTVox, Nrecon), Dragonfly, Avizo 3D Pro - Availability via VDI Virtual Machine.

DESCRIPTION:
The laboratory is equipped with a Zeiss Xradia 410 Versa 3D microscope to acquire 3D digital images of samples with resolutions down to 0.9 µm, through absorption and phase-contrast imaging. The facility includes software for visualization and quantitative analysis of 3D scans and petrophysical simulations (e.g., permeability). A stage for high-P and T in-situ experiments (dry/wet conditions) allows time-resolved imaging to link 4D microstructural changes with rock properties.

SAMPLE PREPARATION:
Yes. To be discussed with facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Zeiss Scout & Scan and Zeiss XRM reconstructor; image processing and simulators (Avizo/PerGeos, Dragonfly/ORS, ImageJ/Fiji, Python libraries, 3DViewer).

DESCRIPTION:
The Electron Microscopy Laboratory is equipped with a Scios 2 LV (FIB-SEM). The Scios 2 LV is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. Moreover, the Large Area Map software allows the acquisition of large sample areas at high magnification by means of a collage of images. Specifications: - Resolution: 1.5nm - Accelerating voltage: 0.2-30 kV - Maximum probe current: 400 nA - Magnification: from 40x (WD10 mm) to 500.000x - Specimen stage: five axis drive eucentric goniometer stage - Maximum specimen size: 50 mm x 40 mm.

SAMPLE PREPARATION:
No. Thin sections or stubs need to be provided by the user according to our specifications; these samples could be carbon coated at our facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Jeol and Thermo Scientific SPI softwares.

DESCRIPTION:
The Electron Microprobe Laboratory is equipped with JEOL JXA-iSP100 electron microprobe, with five wavelength dispersive spectrometers (12 crystals), an energy dispersive spectrometer and transmission illuminator. The instrument is designed to measure qualitatively composition of a solid polished material on a microscale with high precision (within one percent relative for major constituents) and low detection limits (commonly a few tens to few hundreds ppm). Sample of interest can be as small as a few microns across. Built on the base of scanning electron microscope it has all the capabilities of SEM too. Specifications : - Accelerating voltage: 10-30 kV - Probe current: 5-1000 nA - Samples type: thin sections and one-inch epoxy-samples.

SAMPLE PREPARATION:
No. Thin sections or stubs need to be provided by the user according to our specifications; these samples could be carbon coated at our facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Jeol and Thermo Scientific SPI softwares.

DESCRIPTION:
FEG-SEM equipped with a Symmetry EBSD camera and EDS detector from Oxford Instruments. Inclined column allows the mapping of relatively large areas (few cm²). Instruments & an EDS detector allowing simultaneous crystallographic and chemical mapping of thin sections or polished sections (up to 4x3 cm). The maximum resolution of crystallographic maps on geological materials is around 0.05 μm, and the acquisition frequency can reach 500 Hz.

SAMPLE PREPARATION:
Yes. Sample (e.g. thin section) polishing can be done by the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Aztec software, Channel 5, MTEX (https://mtex-toolbox.github.io)

DESCRIPTION:
LIBS setup for solid samples, chemical imaging and depth profiling, LOD 1-100 ppm, spatial resolution 10-150 um, scanning area 100×100 mm2, wide range of elements (including Li, Be, Na, Mg, N, C). Laser pulse energy up to 50 mJ, laser wavelengths (266, 532, 1064 nm), scanning rate 50 Hz . Spectral range covering 180-1000 nm. LIBS setup including LIBS Interaction Chamber, capability to simulate atmospheric conditions of celestial bodies, e.g., Mars: CO2 at 10 mbar, and even the Moon.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
In-house software.

DESCRIPTION:
LIBS setup for solid samples, chemical imaging and depth profiling, LOD 1-100 ppm, spatial resolution 10-150 um, scanning area 100×100 mm2, wide range of elements (including Li, Be, Na, Mg, N, C). Laser pulse energy up to 50 mJ, laser wavelengths (266, 532, 1064 nm), scanning rate 50 Hz . Spectral range covering 240-800 nm.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
In-house software.

DESCRIPTION:
Atomic Force Microscope (AFM) with atomic-scale resolution for detailed surface mapping. Operates in various environments including air and liquid. Enables measurement of mechanical, electrical, and topographical properties simultaneously, supporting applications in materials science, nanotechnology, and biological systems.

SAMPLE PREPARATION:
No. Users must prepare samples according to AFM compatibility requirements. Mounting assistance and basic guidance provided by facility staff.

SOFTWARE AVAILABLE AT THE FACILITY:
JPK SPM software, Avizo, Dragonfly, MATLAB, Gwyddion.

DESCRIPTION:
Raman-coupled Vertical Scanning Interferometry (Rc-VSI) system combining high-resolution surface topography with chemical analysis. Ideal for studying nanoscale surface reactions, dissolution, growth kinetics, and environmental effects. Enables correlative analysis of surface structure and composition with nanometre precision.

SAMPLE PREPARATION:
No. Users are responsible for preparing samples to meet VSI and Raman compatibility requirements. Facility provides guidance and mounting support where necessary.

SOFTWARE AVAILABLE AT THE FACILITY:
WITec Project FIVE, Avizo, Dragonfly, MATLAB.

DESCRIPTION:
Zeiss Xradia 520 Versa 3D X-ray microscope for high-resolution, non-destructive imaging of internal structures down to sub-micron resolution. Equipped with in situ Deben mechanical testing stage for compression, tension, and indentation experiments, and capable of Lab-DCT for 3D crystallographic information.

SAMPLE PREPARATION:
No. Users must prepare samples according to facility specifications. Mounting assistance is available. Carbon coating is not required.

SOFTWARE AVAILABLE AT THE FACILITY:
Zeiss Scout-and-Scan, Zeiss Reconstructor, Avizo, Dragonfly, proprietary Lab-DCT software, MATLAB (custom scripts).

DESCRIPTION:
Custom-built setup, VISCOM XT9100 microfocus source (Mo, Ag or Cu), Vosskuhler CCD-camera, SCINT-X pixeled scintillator - optimized for 17 keV radiation, 4-μm spatial resolution with frame rates up to 6 per second.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Nikon Inspect-X and CT Pro, VGStudio Max, open-source image processing software.

DESCRIPTION:
Nikon XT H 225 ST, 225kV UltraFocus reflection target (Mo, W, Ag, Cu) and 180 kV transmission target, Perkin Elmer 1620 flat panel detector, 300 µm to 10 µm resolution - depending on the sample size, max sample size 30 cm/50 kg.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Nikon Inspect-X and CT Pro, VGStudio Max, open-source image processing software.

DESCRIPTION:
The UU facility for NanoSIMS, which houses a CAMECA NanoSIMS 50L instrument, will provide comprehensive technical support for the mapping of element and isotope ratios in Earth and environmental materials. The dedicated technician will tune the instrument and perform requested analyses for end-users. Open-source analysis software tools will be provided to TA users, and the facility will offer training on NanoSIMS data processing, analysis, and interpretation. Expert advice on sample preparation will also be available, and users can access the facility both in-person and remotely.

SAMPLE PREPARATION:
Yes. Depending on the type of sample we can offer some final steps in the sample preparation, like fine polishing of embedded rock-like samples, sectioning of embedded biological samples (cells, tissues), and sample coating (gold, platinum, carbon). As this will be very project specific, sample preparation needs to be discussed prior to any measurements with the head of the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Look@NanoSIMS software.

DESCRIPTION:
200 kV (S)TEM. High-brightness X-FEG electron gun, high-resolution imaging, electron diffraction, electron tomography, and high-sensitivity 2D EDX chemical mapping (Super-X).

SAMPLE PREPARATION:
Yes. For efficiency and time management we prefer that TNA users bring their specimens ready for TEM. Nevertheless, we can do basic TEM sample preparation in Nanolab: grid samples, ultramicrotomy, carbon coating of specimens. FIB milling may be arranged elsewhere, subject to availability and timing.

SOFTWARE AVAILABLE AT THE FACILITY:
TEM data processing is performed using Velox, Inspect 3D and Avizo software, plus crystallography software (CrystalMaker, CrystalDiffract, SingleCrystal) is available.

DESCRIPTION:
ThermoFisher Scientific Helios G4 Dual Beam Helios G4 UC. Resolution: 0.6 nm at 30 kV STEM, 0.7 nm at 1 kV, 1.0 nm at 500 V (ICD). Electron beam current range: 0.8 pA to 100 nA, accelerating voltage range: 200 V to 30 kV. Maximum horizontal field width: 2.3 mm at 4 mm WD. Ion beam current range: 0.1 pA to 65 nA, accelerating Voltage range: 500 V to 30 kV. Elstar in-lens SE/BSE detector; Everhart-Thornley SE detector (ETD); Retractable STEM3+ detector with BF/DF/HAADF segments; Gas Injection System; Easylift for precise in situ sample manipulation; AutoTEM wizard automated sample preparation.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

DESCRIPTION:
A FEI (ThermoFisher Scientific) Quanta 3D FEG is a state-of-the-art Dual Beam device. SEM column optimized for high-brightness & high-current at acceleration voltage from 2kV to 30kV and probe currents from 1pA to 65 pA. Magnifications: x30 – x1.000.000; SE & BSE detectors; Low-vacuum SED (used in low vacuum mode); EDAX TEAM software for EBSD and EDS. Maximum electron beam resolution - 0.8 nm at 30kV; Focused Ion Beam Column: Ion source – 1kV to 30 kV. Maximum ion beam resolution - 7 nm at 30kV. Omniprobe nanomanipulator. In situ Pt and C gas injection systems. Avizo Fire for 3D reconstruction in nanotomography.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

DESCRIPTION:
The ZEISS Ultra Plus field emission scanning electron microscope allows recording of high-resolution images. The complete detection system of the Ultra Plus combines various detectors: the In-Lens & SE detector for high-resolution images, the In-Lens Energy Selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for an impressive material contrast of each sample, and energy dispersive spectroscopy (EDS) for elemental analysis. We can use the ZEISS Ultra Plus in a variety of scientific areas, including material and geological research. In life sciences, the Ultra Plus allows us to easily analyze samples with high throughput and receive large amounts of data. In addition, the Ultra Plus also offers the possibility of analysing natural biological samples with cryo-attachment and cathodoluminescence (KL) for minerals and material science samples.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

DESCRIPTION:
FEI Tecnai G2 F20 X-Twin (200 kV) (space resolution is < 0.3 nm at 200 kV); FEG electron source; HAADF Detector; Gatan Tridiem (EELS, EFTEM); EDAX energy dispersive X-ray spectroscopy system; TEM sample holders: Gatan double-tilt holder; Single-tilt tomography holder; low background double-tilt holder; Single-tilt rotation holder; Gatan double-tilt liquid nitrogen holder; Gatan heating holder.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

DESCRIPTION:
ThermoFisher Scientific Themis Z (3.1); Cs S-CORR Probe Corrector (80-300 kV) (space resolution is < 0.06 nm at 300 kV); X-FEG electron source with a monochromator (energy resolution is < 0.3 eV); HAADF, DF2, DF4 and BF Detectors; STEM Imaging of light elements; SuperX energy dispersive X-ray spectroscopy system; Gatan Imaging Filter Continuum ER/1065 (EELS, EFTEM); TEM, STEM and EDX Tomography Data Acquisition Software; Low-dose Exposure Technique; Precession electron diffraction.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

DESCRIPTION:
High-resolution 3D X-ray microscope (XRM) designed for non-destructive in-situ analysis ((1) load cell, Deben, CT5000, (2) in-situ flow cell, self-developed, 2 sizes). Sample sizes up to 300 mm, supporting weights up to 15 kg. Up to 0.7 μm true spatial resolution, with a minimum reasonable voxel size of approx. 0.4 µm. Key specifications: X-ray source: 30-160 keV, maximum power 10 W, 12 filters for energy selection (artefact reduction + contrast enhancement), 2k x 2k pixel detector. Two-stage magnification (0.4x macro / 4x, 20x, 40x) for multi-scale zoom-in tomography.

SAMPLE PREPARATION:
Yes. We offer a guided sample preparation of particulate samples. Also assistance in fixing complex geometries supported by 3D printing (please register early enough if required).

SOFTWARE AVAILABLE AT THE FACILITY:
VGStudioMax, Dragonfly, Ilastik.

DESCRIPTION:
A versatile micro-CT system optimized for multi-scale 3D and high temporal resolution 4D imaging from core samples down to pore samples. Key benefits: • Multi-scale imaging from core down to pore/grain scale • Volume-of-Interest Scanning (VOIS) • Scan up to 1 m tall cores • Fast scanning & high sample throughput • In situ integration option • Dynamic micro-CT acquisition with temporal resolutions < 10 seconds • Software tools for dynamic acquisition, reconstruction and visualization

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
The Environmental Micro-CT or EMCT system is a rather unique, gantry-based high-resolution setup developed for fast CT scanning and in-situ monitoring. The design of a horizontal gantry allows for the installation of a large number of add-on modules such as flow cells, pressure stages, temperature stages, in a convenient vertical position without a limitation on tubes and wires. Furthermore, the components are chosen to enable fast and continuous CT scanning at up to 2 full rotations per minute.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
The High-Energy CT system Optimized for Research or HECTOR is the workhorse of our systems. It is equipped with a 240 kV X-ray tube from X-RAY WorX, a Varex XRD 4343 flat-panel detector and a rotation stage able to carry samples up to 80 kg. Mounted on a total of 5 motorized linear stages, this system covers a very wide range of samples with a best achievable spatial resolution of approximately 3 micron and an image resolution of 2800x2800 pixels. Two additional piezo stages allow for an exact positioning of the sample on the rotation axis.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
The very high resolution scanner Medusa combines a Photonic Science VHR detector with a large-area Varian flat-panel detector to allow for both low-density objects such as biological tissue, and high-density samples such as geomaterials. Both detectors are mounted on motorized linear stages for easy and fast switching and high accuracy. The setup also allows for a very long propagation distance of 1.4m, which can be exploited for phase-contrast experiments. The FeinFocus transmission tube allows for a resolution of approximately 0.9 µm and for X-ray targets of different material and thickness.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
This versatile multi-resolution X-ray tomography scanner is equipped with two separate X-ray tubes and two different X-ray detectors to allow for optimal scanning conditions for a very wide range of samples. The open-type Hamamatsu transmission tube is used for very high resolution CT scans, where a resolution of approximately 0.9 micron can be achieved (given very small samples), whereas the closed-type Hamamatsu directional tube head is used for larger samples. On the detector side, an 11 megapixel Photonic Science VHR CCD camera with a pixel size of approximately 7² µm² is complemented with a large-area Varian flat-panel detector.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
Dual beam Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) instrument SEM/FIB, Pt, Teos, and Carbon Deposition. FIB/SEM tomography.

SAMPLE PREPARATION:
Yes. FIB preparation of samples for TEM analysis is part of the unit access offered. Standard preparation procedures, susch as dispersion of powder suspensions are supported in the facility, subject to discussion with the user.

SOFTWARE AVAILABLE AT THE FACILITY:
Access to propriatary manufacturers software, including Velox, TIA, INCA/AZtec, Digital Micrograph, Atlas, licenced software such as as well as Avizo, Dragongly. Use of open-source software such as Hyperspy and Sigma are emphasised.

DESCRIPTION:
Dual beam Focused Ion Beam (FIB) Scanning Electron Microscope (SEM) instrument SEM/FIB, TEM lamella sample preparation (Omniprobe), Pt, Teos, and Carbon Deposition. FIB/SEM tomography, EDS and Electron Backscattered Diffraction analysis are provided , with Oxford Instruments detectors.

SAMPLE PREPARATION:
Yes. FIB preparation of samples for TEM analysis is part of the unit access offered. Standard preparation procedures, susch as dispersion of powder suspensions are supported in the facility, subject to discussion with the user.

SOFTWARE AVAILABLE AT THE FACILITY:
Access to propriatary manufacturers software, including Velox, TIA, INCA/AZtec, Digital Micrograph, Atlas, licenced software such as as well as Avizo, Dragongly. Use of open-source software such as Hyperspy and Sigma are emphasised.

DESCRIPTION:
Aberration Corrected atomic resolution, monochromated, Scanning Transmission Electron Microscope. The instrument offers EDS (Thermo Fisher Super-X) and high energy resolution EELS analysis (Gatan Continuum 1066). Magnetic imaging, Lorenz magnetic imaging, electron holography Scanning Electron Diffraction (SED) (including Quantum Detectors Merlin direct detection camera). The primary Aberration Corrected atomic resolution, monochromated, Scanning Transmission Electron Microscopy (STEM). The instrument offers EDS (Thermo Fisher Super-X) and high energy resolution EELS analysis (Gatan Continuum 1066, 0.15 eV or better). A rotatable Mollenstedt-Ducker biprism allows for off-axis holography and a Lorentz lens allows field-free imaging of magnetic specimens. Scanning Electron Diffraction (SED) with precession (Nanomegas) capability includes a Quantum Detectors Merlin direct detection camera. The primary beam energy is 300 kV and the system is also aligned at 80 kV and 40 kV.

SAMPLE PREPARATION:
Yes. FIB preparation of samples for TEM analysis is part of the unit access offered. Standard preparation procedures, susch as dispersion of powder suspensions are supported in the facility, subject to discussion with the user.

SOFTWARE AVAILABLE AT THE FACILITY:
Access to propriatary manufacturers software, including Velox, TIA, INCA/AZtec, Digital Micrograph, Atlas, licenced software such as as well as Avizo, Dragongly. Use of open-source software such as Hyperspy and Sigma are emphasised.

DESCRIPTION:
TEM, STEM and imaging, Scanning Electron Diffraction (SED) with precession (Nanomegas) and electron tomography. In situ-studies are enabled by Gatan OneView camera combined with heating (DENS Wildfire) and liquid (Protochips Poseidon) holders.

SAMPLE PREPARATION:
Yes. FIB preparation of samples for TEM analysis is part of the unit access offered. Standard preparation procedures, susch as dispersion of powder suspensions are supported in the facility, subject to discussion with the user.

SOFTWARE AVAILABLE AT THE FACILITY:
Access to propriatary manufacturers software, including Velox, TIA, INCA/AZtec, Digital Micrograph, Atlas, licenced software such as as well as Avizo, Dragongly. Use of open-source software such as Hyperspy and Sigma are emphasised.

DESCRIPTION:
TEM imaging and fast chemical mapping in scanning transmission electron microscope (STEM). Its primary beam energy is 200keV, with a lower energy of 80 keV for materials sensitive to knock-on damage. FEIs Super-X system provides high collection (>0.9 sr solid angle) and high count rates (>250 kcps) EDS analysis. Electron Energy Loss Spectroscopy (EELS) using Gatan's Enfinium ER 977 spectrometer allows Scan Module for Dual EELS (sequential low-loss and high-loss spectrum acquisition) and RangeEELS.

SAMPLE PREPARATION:
Yes. FIB preparation of samples for TEM analysis is part of the unit access offered. Standard preparation procedures, susch as dispersion of powder suspensions are supported in the facility, subject to discussion with the user.

SOFTWARE AVAILABLE AT THE FACILITY:
Access to propriatary manufacturers software, including Velox, TIA, INCA/AZtec, Digital Micrograph, Atlas, licenced software such as as well as Avizo, Dragongly. Use of open-source software such as Hyperspy and Sigma are emphasised.