EXCITE2 Call 5

DESCRIPTION: RX Solutions EasyTOM XL Ultra

SAMPLE PREPARATION: No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY: Avizo, Dragonfly, X-AID, PyPore3D

DESCRIPTION: XRadia MicroXCT-400

SAMPLE PREPARATION: No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY: ZAG Avizo, Dragonfly, X-AID, PyPore3D

DESCRIPTION:
High-performance Windows-based workstations providing dedicated personal workspace equipped with necessary operational memory and graphic cards to handle big CT data set (over 100GB), can be accessed both on-site and remotely.

SOFTWARE AVAILABLE AT THE FACILITY:
VG Studio MAX, Avizo, GOM Inspect (dimensional measurements on mesh models), SimLab soft (3D interactive outputs).

DESCRIPTION:
Atomic force microscope NX20 (Park Systems). This AFM allows working in contact, non-contact, lateral force microscopy (LFM), phase imaging and tapping AFM modes. It has a scan range of up to 100 µm. It has an open space for samples up to 150 mm x 150 mm, and thickness up to 20 mm. It has a universal liquid cell (open or closed) with liquid/gas perfusion with temperature control range up to +180º C (in air) or up to +150ª C (within liquids). Since its acquisition, it has been offering service to in-house and international researchers studying morphological and chemical-physical properties of molecular nanostructures; dynamic processes, such as mineral dissolution and growth; protein aggregates, biofilms and colloids; nanolithography, electronic conductivity and mechanical properties of electronic circuits.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
High resolution transmission electron microscope, FEI (ThermoFischer Scientific) TITAN with 300 kV acceleration voltage. The Titan microscope is a image-aberration-corrected STEM/TEM with .07 nm resolution, equipped with a high-brightness Schottky-field emission e-source, and a high-resolution Gatan Imaging Filter (GIF). It has two 2048x2048 slow-scan CCD cameras. The high resolution STEM is equipped with HAADF detector and EDAX energy dispersive X-ray for AEM analyses. Includes different sample holder, one of them a tomography holder with ± 80 degrees to minimize the missing wedge in 3D reconstructions.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
X-ray micro-CT ZEISS Xradia 510 Versa. This high resolution µ-CT is able to analyze non-destructively a whole range of sample types (solid and/or liquid) and geometries. Extending synchrotron-caliber performance, it achieves 0.7 μm true spatial resolution and voxel size of 70 nm. It has advanced absorption contrast along with innovative phase contrast. Multi-length scale capabilities enable to image the same sample across a wide range of magnifications, reducing dependence upon geometric magnification, thereby enabling to maintain submicron resolution down to 700 nm at large working distances. Additional capabilities: a) T-controlled stage; b) Mechanical testing device; c) Flow-through cylindrical stage.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Scout&Scan TM, Scout&Scan TM Control Systems Reconstructor, Dragonfly TM, Velox, Digital micrograph.

DESCRIPTION:
High-quality data CT using special helical trajectory, wide cone beam, iterative reconstruction algorithm. Perfect machine for cylindrical shaped samples like drill cores and battery cells.

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect.

DESCRIPTION:
Industrial CT with a powerful microfocus tube, air-bearings, fixed detector-source distance for better metrological performance. Excellent device for structural analysis of high-dense samples including various forms of metals.

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect.

DESCRIPTION:
Versatile CT system with a walk-in protection cabinet equipped with X-ray micro-and nano-focus sources and a large 4k detector, 7 axes on massive granite base and air-condition. Suitable system for large scale samples, porosity analysis of small pieces of rocks, and in-situ experiments. The In-situ box (CactuX s.r.o) allowing for the simulation of real-life conditions during the CT analysis, offering temperature control (-30 °C to +60 °C), a charging/discharging function to investigate batteries (up to 30 A) and a power supply function (up to 30 A/60 V) with the sample area of 35 mm x 65 mm is also available.

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect

DESCRIPTION:
An X-ray microscope and submicron-CT system capable of high-quality scans with voxel sizes less than 0.19 μm in a field of view of 0.9 × 0.75 mm. Its dual-target X-ray source and phase-contrast capability facilitate high-contrast imaging of both light materials like plants, polymers, or textile fibers, and denser samples from fields such as geology or cultural heritage.

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect.

DESCRIPTION:
CT system with a walk-in air-conditioned protection cabinet, equipped with anti-vibration system, meso- and mini-focus X-ray tubes and 2k detector, precise granite-based 7 axes manipulation system for heavy sample handling (objects up to 200 kg heavy and 2 m in height) and scatter correction, helical scanning and 2D inspection package. 

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Volume Graphics, Avizo, GOM Inspect

DESCRIPTION:
Local Electrode Atom Probe with reflectron ion flight path. Voltage and UV laser pulsing modes.

SAMPLE PREPARATION:
Yes. Atom probe tomography is undertaken on small, needle-shaped specimens. These specimens are prepared at Curtin University using site-specific targeting in the FIB-SEM. Atom probe specimens are typically taken from flat petrographic thin sections or polished blocks . We do not manufacture thin sections or polished blocks within the Facility and users must provide these.

SOFTWARE AVAILABLE AT THE FACILITY:
Data Acquisition and Processing will utilise Cameca's AP Suite software and is available as part of the standard workflow.

DESCRIPTION:
TESCAN Lyra3 Ga+ focused ion beam SEM (FIB-SEM). MIRA Electron column (Field Emission). Cobra Ion column (monoisotopic 69Ga+). MonoGIS with Pt reservoir. SmarAct Nanomanipulator. Tofwerk ToF-SIMS. Oxford EDS detector. Oxford EBSD detector.

SAMPLE PREPARATION:
Yes. Atom probe tomography is undertaken on small, needle-shaped specimens. These specimens are prepared at Curtin University using site-specific targeting in the FIB-SEM. Atom probe specimens are typically taken from flat petrographic thin sections or polished blocks . We do not manufacture thin sections or polished blocks within the Facility and users must provide these.

SOFTWARE AVAILABLE AT THE FACILITY:
Data Acquisition and Processing will utilise Cameca's AP Suite software and is available as part of the standard workflow.

Addons

• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - EBSD detector (Electron Backscatter Diffraction)
• Detector - CL detector (Cathodoluminescence)
• Detector - ToF-SIMS detector (Time-of-flight SIMS)

DESCRIPTION:
The Tescan DynaTOM targets dynamic tests or the analysis of non-consolidated samples. The system is equipped with a 3Mpx flat panel detector and an X-ray source, mounted onto a horizontal gantry. The samples remain static during the analysis. The system offers voxel sizes ranging between ~1 and 150µm (unbinned data) on millimeter to decimeter-sized samples. Designed to perform in situ/in operando analyses. Test cell to be provided by the user.

SAMPLE PREPARATION:
Precising drill available to core samples with diameters ranging from ~1 to 40 mm (depending on sample). Safety hood and precision balance available for preparation of solutions or working with chemicals.

SOFTWARE AVAILABLE AT THE FACILITY:
CPU/GPU image processing server available on site. Several software packages for image analysis ORS Dragonfly, Fiji) and data processing (Matlab, Python) are available.

DESCRIPTION:
The Tescan UniTOM XL Spectral is a versatile system. It can handle a wide range of sample sizes (up to a meter in length) and can flexibly trade-off spatial and temporal resolution thanks to a 300W source and an 8Mpx flat panel detector. An in-situ stage enables in situ/in operando experiments. Test cell to be provided by the user. The system also features a spectral line detector with up to 128 channels enabling non-destructive 3D chemical differentiation.

SAMPLE PREPARATION:
Precising drill available to core samples with diameters ranging from ~1 to 40 mm (depending on sample). Safety hood and precision balance available for preparation of solutions or working with chemicals.

SOFTWARE AVAILABLE AT THE FACILITY:
CPU/GPU image processing server available on site. Several software packages for image analysis ORS Dragonfly, Fiji) and data processing (Matlab, Python) are available.

DESCRIPTION:
The Zeiss Xradia Versa 510 targets sub-micron imaging. It offers voxel sizes ranging between ~250nm and ~40µm (unbinned data) on respectively millimeter to centimeter-sized samples. The system is equipped with a 4Mpx CCD detector. An in-situ stage enables to perform in situ analyses. Test cell to be provided by the user.

SAMPLE PREPARATION:
Precising drill available to core samples with diameters ranging from ~1 to 40 mm (depending on sample). Safety hood and precision balance available for preparation of solutions or working with chemicals.

SOFTWARE AVAILABLE AT THE FACILITY:
CPU/GPU image processing server available on site. Several software packages for image analysis ORS Dragonfly, Fiji) and data processing (Matlab, Python) are available.

DESCRIPTION:
Lab-scale micro computed tomography scanner to characterize microstructures of a wide variation of materials and sample diemensions. Samples with diameters of 1 mm to up to 12 cm can be scanned at with a maximum of 3 micrometer resolution. Large samples (>30 cm in length) can be scanned and the equipment has the capability to perform dynamic imaging.

SAMPLE PREPARATION:
Yes. Coring options available for all sizes of samples from large blocks. Precision polishing also possible.

SOFTWARE AVAILABLE AT THE FACILITY:
Phoenix reconstruction software, Avizo 3D analyses software, Panthera reconstruction software, Dragonfly 3D analyses software Matlab/Python routines, Image J.

DESCRIPTION:
Lab-scale computed tomography scanner to image large samples focused on in-situ testing and imaging of materials. RocksSamples with diameters of 15 cm and length of over a meter can be scanned in tens of seconds at a resolution of at minimum 500 micrometer.

SAMPLE PREPARATION:
Yes. Coring options available for all sizes of samples from large blocks. Precision polishing also possible.

SOFTWARE AVAILABLE AT THE FACILITY:
Phoenix reconstruction software, Avizo 3D analyses software, Panthera reconstruction software, Dragonfly 3D analyses software Matlab/Python routines, Image J.

DESCRIPTION:
FIB-SEM with Cryostage. Nordlys EBSD, Oxford xxx EDS, Gatan CL.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

Addons

• Detector - EBSD detector (Electron Backscatter Diffraction)
• Stage - Cryogenic stage
• Detector - BSE detector (Backscatter Electron)
• Detector - SE detector (Secondary Electron)

DESCRIPTION:
Environmental SEM with Peltier cooling stage, 2x Bruker EDS and automated mineralogy.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

Addons

• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy) - Bruker XFlash 6-60
• Stage - Peltier cooling stage
• Detector - BSE detector (Backscatter Electron)
• Detector - SE detector (Secondary Electron)

DESCRIPTION:
High-end SEM with low vacuum capabilities. Symmetry EBSD detector, Oxford xxx EDS, Delmic CL, Quorum Cryostage.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

Addons

• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - EBSD detector (Electron Backscatter Diffraction)
• Stage - Cryogenic stage
• Detector - BSE detector (Backscatter Electron)
• Detector - SE detector (Secondary Electron)
• Detector - CL detector (Cathodoluminescence)

DESCRIPTION:
30-300 kV (S)TEM. Double aberration corrected microscope with a variable acceleration voltage (30, 80, 200 and 300 kV), enabling high-resolution imaging up to 50 pm both in TEM and STEM imaging mode. Equipped with EDX spectrometry for chemical mapping, and ultra-high-resolution electron energy loss spectrometry (UHR-EELS) enabled by its double monochromator and Gatan Continuum filter. It also has a direct-direction Gatan K3 IS camera allowing imaging of soft and beam-sensitive materials.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

Addons

• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - EELS detector (Electron Energy Loss Spectroscopy)

DESCRIPTION:
200 kV (S)TEM. High-brightness X-FEG electron gun, high-resolution imaging up tot 1.1 Å, electron diffraction, electron tomography, and high-sensitivity 2D EDX chemical mapping (Super-X).

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
Field Emission Electron probe microanalyser, equipped with 5 WDS spectrometers, SDD ED system, CL system (panchromatic imaging and xCLent hyperspectral CL).

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

Addons

• Detector - WDS detector (Wavelength-dispersive X-ray Spectroscopy)
• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - BSE detector (Backscatter Electron)
• Detector - SE detector (Secondary Electron)

DESCRIPTION:
High-resolution X-ray tomography microscope system equipped with a 160kV high-energy, high-power microfocus X-ray source, several high-contrast detectors and a large flat panel detector as well as in situ experimental capabilities.

SAMPLE PREPARATION:
No. Only carbon coating at facility. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Avizo, Aztec, Esprit, Zen, Atlas, Velox, GMS3, STEMx, Donovan, Zeiss Reconstructor.

DESCRIPTION:
The equipment can be run at high vacuum, low vacuum, or environmental mode, allowing imaging and chemical analysis of samples with or without a conductive coat. Moreover, the facility also hosts a SEM equipped with a cryogenic system.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
Equipment calibrated to quantify volatiles such as CO2, CH4 and N2 in fluid inclusions. The equipment can be coupled to a Linkam heating -freezing stage.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
The equipment offers a complete range of imaging technologies that enable acquiring Raman data from minute traces of material easily producing detailed chemical images and highly specific data from discrete points, lines, areas, and even volumes. With the possibility of using different excitation lasers (785, 532 nm) and three diffraction gratings (2400, 1800 and 1200lines/mm) they enable spectral resolution better than 2 cm-1.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
The InVia® Qontor includes an automatized piezoelectricstage, enabling 2D-Raman imaging and depth measurements (lateral and vertical resolution: 100 and 15 nm). The spectrometer is coupled to a Linkam Stage (80 – 1500 K), a closed-cycle He cryostat (10- 300K), and a continuous flow He cryostat with superconducting coil to applied external magnetic field (up to 7T; down to 3K). A high-pressure diamond anvil cell (up to 100 GPa) and high temperature (300 – 1000K) is also available for measurements.

SAMPLE PREPARATION:
Yes. Samples for SEM-EDS will be coated (carbon or Au-Pd) at the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Labspec; Particle finder; CalRam.

DESCRIPTION:
The nano-indenter located in the Friction Lab of the Department of Geosciences, UiO, is a G200X instrument that quickly delivers accurate, quantitative results of nano-mechanical testing of materials. It can be used for hardness, modulus, fracture toughness, and other property measurements, high-speed material property maps, as well as for creep tests. The instrument was purchased in 2021 and is equipped with two actuators that can be used to apply force up to 500 mN and in continuous stiffness mode (CSM).

SAMPLE PREPARATION:
No. Samples must be polished by the users (EBSD quality) before testing.

SOFTWARE AVAILABLE AT THE FACILITY:
Acquisition and processing software from the manufacturer (InView software). Data can be exported and processed with Microsoft Excel and MatLab.

DESCRIPTION:
Hitachi SU5000 FEG-SEM including low-vacuum mode. Oxford Instruments: Symmetry S (EBSD), Ultim Max Infinity 40 (EDS) and BEX (combined BSE and EDS) detectors, Automated Mineralogy. Software CrossCourt4 Rapide for high-angular resolution EBSD (HR-EBSD). Delmic Sparc CL system with hyperspectral analysis.

EQUIPMENT (UN)AVAILABILITY:
The equipment will not be available 26.10.-17.11.

SAMPLE PREPARATION:
Yes. Carbon coater Cressington 208C, vibratory polishing machine QPol Vibro (for EBSD samples).

SOFTWARE AVAILABLE AT THE FACILITY:
AZtec (EDS, EBSD), CrossCourt4 Rapide (HR-EBSD), Odemis (CL).

Addons

• Detector - CL detector (Cathodoluminescence) - Delmic Sparc Advanced CL system
• Detector - EBSD detector (Electron Backscatter Diffraction) - Oxford Instruments Symmetry S
• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy) - Oxford Instruments Ultim Max infinity 40
• Detector - BSE detector (Backscatter Electron) - Oxford Instruments BEX (BSE-EDS)

DESCRIPTION:
The Nesocan N80 has an X-ray source of 30-110kV, up to 16 W, 7 Mp Flat-Panel pixels. Pixel size: min 1.3 μm; Resolution 3 µm in voxel can be reached, depending on the sample.

SAMPLE PREPARATION:
Yes. Laboratory available for basic sample preparation (dehydration, staining, embedding).

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker (CTAn, Dataviewer, CTVox, Nrecon), Dragonfly, Avizo 3D Pro - Availability via VDI Virtual Machine

DESCRIPTION:
The SkyScan 1172 microCT has an X-ray source of 30-100kV, 4-10 W, CCD detector 4kx4kx3k pixels. Pixel size: 0.9 μm to 25 μm; Resolution 3 µm in voxel can be reached, depending on the sample.

SAMPLE PREPARATION:
Yes. Laboratory available for basic sample preparation (dehydration, staining, embedding).

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker (CTAn, Dataviewer, CTVox, Nrecon), Dragonfly, Avizo 3D Pro - Availability via VDI Virtual Machine.

DESCRIPTION:
The SkyScan 2211 Multiscale XCT. It requires small samples in order to reach submicron resolution (pixel size ~300 nm). The sample size should be around 1 mm in diameter and composed of low density materials. Resolution 900 nm in voxel. For high energies (70 kV > Energy > 160 kV), large samples can be scanned (up to 15 cm in diameter, and 20 cm high, depending on the composition of the sample. Pixel size can span from 8 um to 50 um

SAMPLE PREPARATION:
Yes. Laboratory available for basic sample preparation (dehydration, staining, embedding).

SOFTWARE AVAILABLE AT THE FACILITY:
Bruker (CTAn, Dataviewer, CTVox, Nrecon), Dragonfly, Avizo 3D Pro - Availability via VDI Virtual Machine.

DESCRIPTION:
The laboratory is equipped with a Zeiss Xradia 410 Versa 3D microscope to acquire 3D digital images of samples with resolutions down to 0.9 µm, through absorption and phase-contrast imaging. The facility includes software for visualization and quantitative analysis of 3D scans and petrophysical simulations (e.g., permeability). A stage for high-P and T in-situ experiments (dry/wet conditions) allows time-resolved imaging to link 4D microstructural changes with rock properties.

SAMPLE PREPARATION:
Yes. To be discussed with facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Zeiss Scout & Scan and Zeiss XRM reconstructor; image processing and simulators (Avizo/PerGeos, Dragonfly/ORS, ImageJ/Fiji, Python libraries, 3DViewer).

DESCRIPTION:
The Electron Microscopy Laboratory is equipped with a Scios 2 LV (FIB-SEM). The Scios 2 LV is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. Moreover, the Large Area Map software allows the acquisition of large sample areas at high magnification by means of a collage of images. Specifications: - Resolution: 1.5nm - Accelerating voltage: 0.2-30 kV - Maximum probe current: 400 nA - Magnification: from 40x (WD10 mm) to 500.000x - Specimen stage: five axis drive eucentric goniometer stage - Maximum specimen size: 50 mm x 40 mm.

SAMPLE PREPARATION:
No. Thin sections or stubs need to be provided by the user according to our specifications; these samples could be carbon coated at our facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Jeol and Thermo Scientific SPI softwares.

DESCRIPTION:
The Electron Microprobe Laboratory is equipped with JEOL JXA-iSP100 electron microprobe, with five wavelength dispersive spectrometers (12 crystals), an energy dispersive spectrometer and transmission illuminator. The instrument is designed to measure qualitatively composition of a solid polished material on a microscale with high precision (within one percent relative for major constituents) and low detection limits (commonly a few tens to few hundreds ppm). Sample of interest can be as small as a few microns across. Built on the base of scanning electron microscope it has all the capabilities of SEM too. Specifications : - Accelerating voltage: 10-30 kV - Probe current: 5-1000 nA - Samples type: thin sections and one-inch epoxy-samples.

SAMPLE PREPARATION:
No. Thin sections or stubs need to be provided by the user according to our specifications; these samples could be carbon coated at our facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Jeol and Thermo Scientific SPI softwares.

DESCRIPTION: FEG-SEM equipped with a Symmetry EBSD camera and EDS detector from Oxford Instruments. Inclined column allows the mapping of relatively large areas (few cm²). Instruments & an EDS detector allowing simultaneous crystallographic and chemical mapping of thin sections or polished sections (up to 4x3 cm). The maximum resolution of crystallographic maps on geological materials is around 0.05 μm, and the acquisition frequency can reach 500 Hz.

SAMPLE PREPARATION: Yes. Sample (e.g. thin section) polishing can be done by the facility.

SOFTWARE AVAILABLE AT THE FACILITY: Aztec software, Channel 5, MTEX (https://mtex-toolbox.github.io)

Addons

• Detector - EBSD detector (Electron Backscatter Diffraction)

DESCRIPTION: Flexible cone-beam X-ray tomography system developed in-house. Resolution ranges from 5 μm (7 mm samples) to 70 μm (100 mm samples). Equipped for complex in situ experiments including mechanical, thermal, humidity, and flow control via Python-based system. X-ray energy: 40–150 kV.

SOFTWARE: Avizo, Dragonfly, Zeiss Reconstructor, MATLABbased in-house software.

Addons

• Stage - Peltier cooling stage
• Stage - Heating stage
• Stage - Mechanical testing stage
• Module - Fluid flow

DESCRIPTION: Micro-CT system with custom modifications. Provides 1.5 μm resolution for 1.2 mm samples and 3 μm for 2.6 mm samples. Tunable energy spectrum for imaging low-Z and high-Z materials. Supports general-purpose imaging for a wide range of research domains.

SOFTWARE: Avizo, Dragonfly, Zeiss Reconstructor, MATLABbased in-house software.

DESCRIPTION: High-resolution nano-CT system with 8 keV monochromatic X-rays. Achieves 60 nm resolution (MTF10%) for 10 μm samples and 130 nm for 60 μm samples. Especially suited for geological materials and capable of imaging low- Z materials. Field of view and contrast optimized for nanoscale studies.

SOFTWARE: Avizo, Dragonfly, Zeiss Reconstructor, MATLABbased in-house software.

DESCRIPTION:
LIBS setup for solid samples, chemical imaging and depth profiling, LOD 1-100 ppm, spatial resolution 20-150 um, scanning area up to 100×100 mm2, wide range of elements (including Li, Be, Na, Mg, N, C). Laser pulse energy up to 50 mJ, laser wavelengths (532, 1064 nm), scanning rate 50 Hz . Spectral range covering 180-1000 nm. LIBS setup including LIBS Interaction Chamber, capability to simulate atmospheric conditions of celestial bodies, e.g., Mars: CO2 at 10 mbar.

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
In-house software.

DESCRIPTION:
LIBS setup for solid samples, chemical imaging and depth profiling, LOD 1-100 ppm, spatial resolution 20-150 um, scanning area up to 100×100 mm2, wide range of elements (including Li, Be, Na, Mg, N, C). Laser pulse energy up to 50 mJ, laser wavelengths (266, 532, 1064 nm), scanning rate 50 Hz. Spectral range covering 240-800 nm.

SAMPLE PREPARATION:
Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
In-house software.

DESCRIPTION:
Atomic Force Microscope (AFM) with atomic-scale resolution for detailed surface mapping. Operates in various environments including air and liquid. Enables measurement of mechanical, electrical, and topographical properties simultaneously, supporting applications in materials science, nanotechnology, and biological systems.

SAMPLE PREPARATION:
No. Users must prepare samples according to AFM compatibility requirements. Mounting assistance and basic guidance provided by facility staff.

SOFTWARE AVAILABLE AT THE FACILITY:
JPK SPM software, Avizo, Dragonfly, MATLAB, Gwyddion.

DESCRIPTION:
Raman-coupled Vertical Scanning Interferometry (Rc-VSI) system combining high-resolution surface topography with chemical analysis. Ideal for studying nanoscale surface reactions, dissolution, growth kinetics, and environmental effects. Enables correlative analysis of surface structure and composition with nanometre precision.

SAMPLE PREPARATION:
No. Users are responsible for preparing samples to meet VSI and Raman compatibility requirements. Facility provides guidance and mounting support where necessary.

SOFTWARE AVAILABLE AT THE FACILITY:
WITec Project FIVE, Avizo, Dragonfly, MATLAB.

DESCRIPTION:
Zeiss Xradia 520 Versa 3D X-ray microscope for high-resolution, non-destructive imaging of internal structures down to sub-micron resolution. Equipped with in situ Deben mechanical testing stage for compression, tension, and indentation experiments, and capable of Lab-DCT for 3D crystallographic information.

SAMPLE PREPARATION:
No. Users must prepare samples according to facility specifications. Mounting assistance is available. Carbon coating is not required.

SOFTWARE AVAILABLE AT THE FACILITY:
Zeiss Scout-and-Scan, Zeiss Reconstructor, Avizo, Dragonfly, proprietary Lab-DCT software, MATLAB (custom scripts).

Addons

• Stage - Deben mechanical testing stage - Deben mechanical testing stage for in-situ observations of compression, tension and indentation experiments
• Module - diffraction contrast tomography (Lab-DCT) - diffraction contrast tomography (Lab-DCT) to retrieve 3D crystallographic information in combination with standard absorption tomography.

DESCRIPTION:
Custom-built setup, VISCOM XT9100 microfocus source (Mo, Ag or Cu), Vosskuhler CCD-camera, SCINT-X pixeled scintillator - optimized for 17 keV radiation, 4-μm spatial resolution with frame rates up to 6 per second.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Nikon Inspect-X and CT Pro, VGStudio Max, open-source image processing software.

DESCRIPTION:
Nikon XT H 225 ST, 225kV UltraFocus reflection target (Mo, W, Ag, Cu) and 180 kV transmission target, Perkin Elmer 1620 flat panel detector, 300 µm to 10 µm resolution - depending on the sample size, max sample size 30 cm/50 kg.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Nikon Inspect-X and CT Pro, VGStudio Max, open-source image processing software.

DESCRIPTION:
The UU facility for NanoSIMS, which houses a CAMECA NanoSIMS 50L instrument, will provide comprehensive technical support for the mapping of element and isotope ratios in Earth and environmental materials. The dedicated technician will tune the instrument and perform requested analyses for end-users. Open-source analysis software tools will be provided to TA users, and the facility will offer training on NanoSIMS data processing, analysis, and interpretation. Expert advice on sample preparation will also be available, and users can access the facility both in-person and remotely.

SAMPLE PREPARATION:
Yes. Depending on the type of sample we can offer some final steps in the sample preparation, like fine polishing of embedded rock-like samples, sectioning of embedded biological samples (cells, tissues), and sample coating (gold, platinum, carbon). As this will be very project specific, sample preparation needs to be discussed prior to any measurements with the head of the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Look@NanoSIMS software.

DESCRIPTION:
200 kV (S)TEM. High-brightness X-FEG electron gun, high-resolution imaging, electron diffraction, electron tomography, and high-sensitivity 2D EDX chemical mapping (Super-X).

SAMPLE PREPARATION:
Yes. For efficiency and time management we prefer that TNA users bring their specimens ready for TEM. Nevertheless, we can do basic TEM sample preparation in Nanolab: grid samples, ultramicrotomy, carbon coating of specimens. FIB milling may be arranged elsewhere, subject to availability and timing.

SOFTWARE AVAILABLE AT THE FACILITY:
TEM data processing is performed using Velox, Inspect 3D and Avizo software, plus crystallography software (CrystalMaker, CrystalDiffract, SingleCrystal) is available.

Addons

• Detector - SuperX 4 detector EDS (Energy Dispersive X-ray Spectroscopy) system

DESCRIPTION:
ThermoFisher Scientific Helios G4 Dual Beam Helios G4 UC. Resolution: 0.6 nm at 30 kV STEM, 0.7 nm at 1 kV, 1.0 nm at 500 V (ICD). Electron beam current range: 0.8 pA to 100 nA, accelerating voltage range: 200 V to 30 kV. Maximum horizontal field width: 2.3 mm at 4 mm WD. Ion beam current range: 0.1 pA to 65 nA, accelerating Voltage range: 500 V to 30 kV. Elstar in-lens SE/BSE detector; Everhart-Thornley SE detector (ETD); Retractable STEM3+ detector with BF/DF/HAADF segments; Gas Injection System; Easylift for precise in situ sample manipulation; AutoTEM wizard automated sample preparation.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Addons

• Detector - BSE detector (Backscatter Electron)
• Detector - SE detector (Secondary Electron)

DESCRIPTION:
A FEI (ThermoFisher Scientific) Quanta 3D FEG is a state-of-the-art Dual Beam device. SEM column optimized for high-brightness & high-current at acceleration voltage from 2kV to 30kV and probe currents from 1pA to 65 pA. Magnifications: x30 – x1.000.000; SE & BSE detectors; Low-vacuum SED (used in low vacuum mode); EDAX TEAM software for EDS. Maximum electron beam resolution - 0.8 nm at 30kV; Focused Ion Beam Column: Ion source – 1kV to 30 kV. Maximum ion beam resolution - 7 nm at 30kV. Omniprobe nanomanipulator. In situ Pt and C gas injection systems. Avizo Fire for 3D reconstruction in nanotomography.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Addons

• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - SE detector (Secondary Electron)
• Detector - BSE detector (Backscatter Electron)

DESCRIPTION:
FEI Tecnai G2 F20 X-Twin (200 kV) (space resolution is < 0.3 nm at 200 kV); FEG electron source; HAADF Detector; Gatan Tridiem (EELS, EFTEM); EDAX energy dispersive X-ray spectroscopy system; TEM sample holders: Gatan double-tilt holder; Single-tilt tomography holder; low background double-tilt holder; Single-tilt rotation holder; Gatan double-tilt liquid nitrogen holder; Gatan heating holder.

SAMPLE PREPARATION:
Yes. Prior to proposal submission, sample preparation (e.g. FIB) should be discussed with the facility.

SOFTWARE AVAILABLE AT THE FACILITY:
Velox, TIA, Digital Micrograph, Tomography, Nanomegas, Aviso, QSTEM, Dr. Probe, TEAM, TSL OIM, Slice&View.

Addons

• Detector - EELS detector (Electron Energy Loss Spectroscopy) - GIF Tridiem
• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - HAADF detector (High-Angle Annular Dark-Field)

Addons

• Detector - EDS detector (Energy Dispersive X-ray Spectroscopy)
• Detector - ADF (Annular Dark-Field)
• Detector - EELS detector (Electron Energy Loss Spectroscopy) - Continuum 1065
• Detector - HAADF detector (High-Angle Annular Dark-Field)
• Holder - Double-tilt holder - low-background
• Holder - Single-tilt holder

DESCRIPTION:
A versatile micro-CT system optimized for multi-scale 3D and high temporal resolution 4D imaging from core samples down to pore samples. Key benefits: • Multi-scale imaging from core down to pore/grain scale • Volume-of-Interest Scanning (VOIS) • Scan up to 1 m tall cores • Fast scanning & high sample throughput • In situ integration option • Dynamic micro-CT acquisition with temporal resolutions < 10 seconds • Software tools for dynamic acquisition, reconstruction and visualization

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

Addons

• Module - Deformation cell - Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0).
• Module - Fluid flow - Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request.
• Module - Freezing cell - Custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

Addons

• Module - Fluid flow - Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request.
• Module - Freezing cell - Custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).
• Module - Deformation cell - Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0).

DESCRIPTION:
The Environmental Micro-CT or EMCT system is a rather unique, gantry-based high-resolution setup developed for fast CT scanning and in-situ monitoring. The design of a horizontal gantry allows for the installation of a large number of add-on modules such as flow cells, pressure stages, temperature stages, in a convenient vertical position without a limitation on tubes and wires. Furthermore, the components are chosen to enable fast and continuous CT scanning at up to 2 full rotations per minute.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

Addons

• Module - Fluid flow - Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request.

DESCRIPTION:
The High-Energy CT system Optimized for Research or HECTOR is the workhorse of our systems. It is equipped with a 240 kV X-ray tube from X-RAY WorX, a Varex XRD 4343 flat-panel detector and a rotation stage able to carry samples up to 80 kg. Mounted on a total of 5 motorized linear stages, this system covers a very wide range of samples with a best achievable spatial resolution of approximately 3 micron and an image resolution of 2800x2800 pixels. Two additional piezo stages allow for an exact positioning of the sample on the rotation axis.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

Addons

• Module - Deformation cell - Deben CT5000 in-situ compression and tensile cell is available (deben.co.uk and doi.org/10.1007/s10064-018-01448-0).
• Module - Fluid flow - Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Add-on modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request.
• Module - Freezing cell - Custom-made freezing cell (doi.org/10.1016/j.conbuildmat.2020.118515).

DESCRIPTION:
The very high resolution scanner Medusa combines a Photonic Science VHR detector with a large-area Varian flat-panel detector to allow for both low-density objects such as biological tissue, and high-density samples such as geomaterials. Both detectors are mounted on motorized linear stages for easy and fast switching and high accuracy. The setup also allows for a very long propagation distance of 1.4m, which can be exploited for phase-contrast experiments. The FeinFocus transmission tube allows for a resolution of approximately 0.9 µm and for X-ray targets of different material and thickness.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
This versatile multi-resolution X-ray tomography scanner is equipped with two separate X-ray tubes and two different X-ray detectors to allow for optimal scanning conditions for a very wide range of samples. The open-type Hamamatsu transmission tube is used for very high resolution CT scans, where a resolution of approximately 0.9 micron can be achieved (given very small samples), whereas the closed-type Hamamatsu directional tube head is used for larger samples. On the detector side, an 11 megapixel Photonic Science VHR CCD camera with a pixel size of approximately 7² µm² is complemented with a large-area Varian flat-panel detector.

SAMPLE PREPARATION:
No. Samples must be prepared by the user according to the facility specifications.

SOFTWARE AVAILABLE AT THE FACILITY:
Octopus, Panthera, VGStudioMax, Avizo, Dragonfly. µ-CT add-on modules are also available for direct observations of fluid flow and weathering experiment. Add-on modules can be made available after initial discussion with the beamline scientist prior to submission of the proposal. Addon modules are available for fluid flow experiments under low confining stresses (max. 30 bar) and without temperature control. Both the fluid flow cell and the pumps can be made available upon request. Also a Deben CT5000 in-situ compression and tensile cell is available (deben. co.uk and doi.org/10. 1007/s10064-018-01448-0), as well as a custom-made freezing cell (doi.org/10.1016/j. conbuildmat.2020.118515).

DESCRIPTION:
Ghent University hosts the Centre of Expertise for X-ray Tomography (UGCT). The centre is operated by a multi-disciplinary and interfaculty collaboration between the Radiation Physics group, the Pore-Scale Processes in Geomaterials Research (PProGRess) group and the Laboratory for Wood Technology (Woodlab). At UGCT, research focuses on and with the technique of X-ray computed tomography (CT). The centre was founded in 2006 and is one of the few CT centres in the world that cover the complete CT workflow: physics and instrumentation, data reconstruction and data analysis. The developed hardware and methodology are primarily used for geological and wood technology research. However, UGCT is also a user facility, offering external research groups and companies access to its unique combination of state-of-the-art in-house developed X-ray CT systems and its CT expertise.

DATA PROCESSING AVAILABLE AT THE FACILITY:
Hardware:

1. 3 standards and 1 heavy duty remotely accesible computing cluster with 256GB RAM/12GB GPU and 384GB RAM/24GB GPU
2. 2 workstations with 383GB RAM/16GB GPU and 128GB RAM / 12GB GPU Software: Avizo, VG Studio, Octopus Analysis, Dragonfly, Panthera

SOFTWARE AVAILABLE AT THE FACILITY:
Aztec, Dragonfly, ImageJ, Ilastik. NVIDIA GraphicS card A40

DESCRIPTION:
Virtual Desktop Infrastructure (VDI) is a virtualisation technology that hosts desktop environments on a central server and deploys them to end-users on request. It allows you to access a Windows-based workstation remotely, providing the flexibility and convenience to work from any location as if you were seated in front of a high-end physical computer. Your access is performed via VMware Horizon software, either by downloading the application, or via your browser.

Our VDI service boasts high-performance virtual machines (VMs) equipped with formidable hardware specifications designed to handle data-intensive analysis with ease. Imagine having a personal workstation powered by a 10-core processor, 128 GB of RAM, and 12 GB of vRAM at your fingertips, perfectly suited for deep learning applications and large dataset computations.

Upon accessing our VDIs, you will find a suite of specialised MicroCT analysis software pre-installed for your convenience, including the entire Bruker Suite software, Thermo Fisher Avizo 3D Pro, and Dragonfly (ORS). These tools are the industry standard for 3D visualisation, data analysis, and processing, enabling you to achieve high-precision results.

Need a particular piece of software not already included? Let us know. While we must evaluate cases involving proprietary software, we are happy to accommodate requests for freeware on a case-by-case basis.

Our VDI workstations are available 24/7, ensuring that you will always have a machine ready for use when inspiration strikes. Moreover, we provide flexible access arrangements—whether you need a VDI for 1 week, 1 month, 3 months, 6 months, or even a full year, we can accommodate your project timeline. For access beyond these standard time frames, reach out to us for a personalised solution.

DATA PROCESSING AVAILABLE AT THE FACILITY:
Avizo, Blender, CTAn, Dataviewer, Dragonfly, FIJI (ImageJ), Ilastik, Meshlab, Meshroom, NRecon, Slicer, Zen